Job Description:

Practical aspect: Co-build a SystemOnChip robustness* bench for a Radar OneChip, evaluate the results and continuously improve in order to prove the match to later gained theoretical insights. Starting with the present level of understanding on a current development, and improve from there.

Theoretical aspect: Developing with the Global Robustness Program Lead a holistic concept for Semiconductor Robustness testing and help making that a standard in NXP (or Semiconductor Industry).

Following steps are envisioned (not all in sequence)

1. Start by joining the Validation Team to build a SystemOnChip robustness bench for a Radar OneChip in the context of a running activity, later taking over the technical ownership for this bench setup.

2. Literature study and research for existing concepts and approaches, if possible including benchmarking inside NXP and across the semiconductor industry

3. Alignment with Design_Enablement, Design and Architecture etc. teams to define pre-mortem criteria to identify potentially vulnerable IPs, design aspects, process-to-architecture mismatches, which enable to eventually come to a meaningful small set of high impact tests.

4. Alignment with Quality, Reliability and Failure Analysis teams to identify post-mortem the most critical IPs which have historically caused robustness fails

5. Combine 3 and 4 to develop an improved and solid understanding on where robustness improvements shall happen, and where most meaningful tests should focus on. Investigate if AI/ML models can help to generate such a focused approach. Prove the validity of 5 on next generation IC.

6. Develop an NXP- or Industry wide standard for Robustness Validation

Your Profile:

• Master degree in electrical engineering or Physics or similar

• Solid semiconductor technology, design and process understanding

• Basic know how in lab bench development and operation such as programming, instrumentation (Boards, Lab equipment,) and signal processing / test data management

• English fluent

• Being curious and self-propelled

• Hands-on attitude

• Good communication skills

• Never give up mindset

* Robustness definition (for this task): A Semiconductor Element may be considered "pass” while being lab-tested once, but has a probability to fail if tested n times. The root cause of failing does NOT lie in mechanical, thermal, electrical etc damage, but in an inherently instable behavior which has a deterministic statistical nature, which is caused (but not detected) by IP design, IP integration or design-to-process flaws that are not adequately captured by simulation today.

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