Haris Noman

• V93000 Test program development, debug and optimization for Automotive System ICs and SoC devices • Consultancy for Customers' Test Engineers during development and debug of V93000 based test solutions • Integration of V93000 Test systems and services into customer's environment • Trainings and Workshops

Engineering Consultant for Advantest Europe GmbH • V93000 Test program development and debug for SoC devices • Test and Validation of SmarTest7 and SmarTest8 software • Maintenance of V93000 test systems including PinScale, SmartScale I-II and Granite systems • Developed automated tool to generate Bosch' V93000 test program release package • Developed automated tool to convert IG-XL Flex vector patterns to V93000 vector patterns • Developed automated tool to analyze V93000 Test system's generated log files

Consultant via TheSensor Technologies GmbH Project: IFX Device Calculator Description:SKILL based MOS characterization tool extracting/calculating small-signal parameters and performing 1-D parametric search for geometry parameter optimization Tools: SKILL, Cadence Virtuoso, TITAN Project: AutoDoc Description: MATLAB based automated documentation tool for measurements and simulations of active and passive devices Tools: MATLAB, TITAN, Spectre, HSPICE

Consultant via Randstad Continuation of Infineon's project related to Master thesis: • Automated layout creation and EM simulation of on-chip inductors and transformers in Cadence environment • Automated netlist simulation of RLCk model using TITAN • Integration to cadence environment

Master Thesis Topic: Definition and Implementation of a quality assurance framework for 2.5D and 3D Electro-Magnetic simulators 1. Mathematical description of characterization parameters for multiport inductors and transformers up to 80 GHz HF using S-Parameters 2. Development of MATLAB based automated environment to characterize multiport inductors and transformers 3. Accuracy check of geometrically parameterized RLCk model to EM simulations

• S-Parameter measurement of different classes of transistors via NWA for LNA and PA • Developed automated tool for NWA 8753B, 8753C, 8753D and 8753E to measure S-parameter of different RF transistors • Developed automated tool for LCR to have CV measurements for different RF diodes • Developed automated tools for Spectrum Analyzer, Oscilloscope, Signal Analyzer etc.

Optimization Methods for Circuit Design, Electronic Design Automation, Memory Technologies for Data Storage, High Speed Digital CMOS Circuits, System-on-Chip Technologies, System-on-Chip Platforms, VHDL Lab, SystemC Lab, Advanced Topics in IC Design, Seminar on Topics in Integrated System Design

Circuit Analysis, Electronics, EM Systems, VLSI, uP, Control Systems, Signal processing, A&D Communication, Programming, CLD, CAD, Data Communication and Networks, Telecomm. Systems