Janani Neelakantan

Designed and implemented a test architecture from the scratch to test the TTCN test cases specified in TBR22 test suites against the DECT systems and successfully tested the Data Link Layer of the DECT portables Analysed the structure of TTCN2 test case and documented a thorough analysis report including the available tools for TTCN2, comparison between TTCN2 and TTCN3 notation, tools for conversion of TTCN2 to TTCN3 and future prospects for such conversion. Designed the whole test set up for protoc

Detailed analysis of capacitive proximity sensors to be used in the mask alignment machines used in the semiconductor industry. Derived noise graphs based on the measurement tests carried out to calculate the distance between the mask holder and the wafer holder and derived conclusion for the same as to which sensor will be best suited Developed plane equations for the screws of the mask holder for precise positioning of the mask holder with respect to wafer holder and programmed the same using Agil

 Developed test scripts for diagnostic purpose using TAS editor for testing CAN Messages using UDP protocol  Designed a user interface for ARM7 LPC2129 using Triton IDE which allowed the user to test the operation of the peripherals of ARM.  Designed and developed low level drivers for ARM 7 LPC2129 for CAN controller to send and receive messages  Designed and developed low level drivers for ARM 7 LPC2129 for I2C controller to read and write messages from and to EEPROM Developed Model-In-Loop and

Industrial Process Control Industrial Process Technology Digital signal Processing Advanced Communications CNC and IPC programming AUTOSAR Advanced Control Systems Real Time systems Integrated circuits design