Dr. Konrad Semmler

Lead Tool Defect Reduction (TDR) Program Fab1

Lead Metrology, Defect Inspection, Test/Laser Repair and YE

- Founder and Owner of fab2fab solutions (www.fab2fab.com) - Project Management and Consulting for the Semiconductor, Solar, Chemical and Pharmaceutical Industry - International Fab2Fab Process- and Technology Transfer - International Technology Licensing - Recruiting of High Tech management and technical experts

-Technology Transfer of DRAM technology to manufacturing sites in Asia and US - Manager of the Transfer team of Product Engineers, Process Integrators, Defect Inspection Experts, Device/Parametrics Experts and Transfer Project Leaders

- Coordination of yield and quality learning across Qimonda manufacturing sites - Owner Joint Improvement Roadmap - Responsible for Technology Synchronisation between Qimonda Manufacturing Sites

Owner Yield Roadmap 110nm Technology - Setup, owned and run a daily Yield Meeting - Coordination of the Yield Learning Core Team (Integration Module leader, Unit Process Coordinators, Device-, Product- and Quality Engineers)

- Responsible for 170nm/140nm wafer yield rootcause analysis for all products - Supervised 4 yield analysis engineers

- Wafer Yield rootcause analysis of SDRAM, DDR1, embedded DRAM, RAMBUS in the 170nm and140nm technology node

Electron microscopic, X-Ray (SAX,WAXS) and calorimetric characterisation of biofilm suspensions

- Structural Characterisation of biofilms and proteins

Semiconductor Physics Thesis : High-field Injection in Indium doped silicon