Mohammad Nayem Sarker

Investigating Manufacturing Failure Mechanisms in ReRAMs: Defects and Faulty Behaviors.

- Identifying key areas on system-level improvements for spectrum analyzers and investigating AI-driven approaches to automate design workflows and optimize RF front end design and component selection.

- Worked on fabrication and characterization of thermal management impact on the switching kinetics of Ta2O5-based crossbar memristive devices, with the goal of achieving gradual switching transitions for implementing in neuromorphic computing applications.

- Assisted students in Digital IC Design lab sessions, focusing on FPGA based digital designing and development tasks using Xilinx Vivado.

- Designed diode and resistor calibration targets in Altium Designer to support transmission line pulser (TLP) testing for electrostatic discharge (ESD) characterization. - Performed system-level test and analysis to evaluate the impact of ESD surge on ICs.