Peter Meyer

Technical leader responsible for key performance specifications through modelling, analysis and algorithm development for signal and image processing in nanometer-level optical measurement systems and fabrication processes for semiconductor manufacturing equipment.

Research and Development Projects in modelling, optimisation and calibration algorithms for semiconductor and optoelectronic devices, medical equipment, precision measurement systems, manufacturing technologies (robotics), production processes (binning), with statistical and financial objectives.

Research and Development Projects in modelling, optimisation and calibration algorithms for industrial robots and manipulators, especially kinematics and dynamics, position metrology, sensor, vision and camera calibration, mapping, localisation and navigation, path planning, motion control and trajectories, statistical error propagation.

Applied Mathematics, Rigid Body Dynamics, Electrodynamics and Field Theory, Semiconductor Physics, Analog and Digital Signal Processing, Electronic Circuits and Systems, Feedback Control Theory.