Sibasish Laha

- Test and Reliability – SiC Rectifiers and MOSFETs in AEC-Q101/AQG-324 - Analysis of lifetime and mission profile of discrete power devices and modules - Collaborate with industrial and research partners on SiC advancements

- Qualification of SiC bipolar devices through the novel PCmsec approach to assess bipolar degradation - Developing reliability test benches for 1200V SiC automotive power modules, diodes, and MOSFETs - Reliability test of diodes as per AQG 324 (Power cycling, HTRB, H3TRB) - Failure analysis using electrical, OM/SAM, LIT, X-Ray, decapsulation & device cross-section

- Quality/Reliability of discrete semiconductor devices in AEC-Q101 - Investigation of abnormal leakage currents in SOT packages after CSAM analysis - Wafer-level BVR stability of SiC MPS diodes under different P-border dose concentrations - Optimization of test setup relating to arcing of HV SiC diodes at high temperatures and high current

- Team lead and mentor - Troubleshoot applications and coordinated disaster recovery testing - Performing routine planned maintenance of IT services with the help of SNow and facilitating RCA to assess and mitigate risk associated with operational and technical change.