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yieldWerx

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yieldWerx

yieldWerxhat einen Beitrag geschrieben.10. Oktober 2017

A complete end-to-end yield management solution (YMS) like yieldWerx let the product engineers focus on high value activities and perform the data cleansing and management functions automatically in the background. http://yieldwerx.com/semiconductor-product-engineering-team/

yieldWerxhat einen Beitrag geschrieben.6. Oktober 2017

The modern day end-to-end yield-management solution provides a powerful wafer-mapping system that enables the user to collect, load, read, and create wafer maps in real-time from the customer’s semiconductor test data. https://www.evaluationengineering.com/wafer-mapping-software-modern-day-high-volume-manufacturing

yieldWerxhat einen Beitrag geschrieben.3. Oktober 2017

Semiconductor testing is a walk on the tightrope because of the latent defects that emerge in chips later in their life when they are part of an end-product. http://yieldwerx.com/pat-gdbn-outlier-detection-moving-beyond-automotive/

yieldWerxhat einen Beitrag geschrieben.26. September 2017

Semiconductors generate big data in 3 places: Design, Wafer Manufacturing and Device Testing. Design data culminates in files to generate up to 100 photo masks and can take thousands of CPU’s a week or more to “Tape Out” these files. yieldwerx.com/big-data-revolution-at-chip-industrys-doorsteps/

yieldWerxhat einen Beitrag geschrieben.19. September 2017

The customer demand for high-quality and reliable semiconductor products is increasing, and semiconductor manufacturers are pushing their supply chains to produce as many devices as they can in a short duration. https://www.evaluationengineering.com/counterfeiting-semiconductor-test-data-management

yieldWerxhat einen Beitrag geschrieben.15. September 2017

Semiconductor chip manufacturing operations produce TBs of data. The biggest challenge that arises in utilizing the big-data environment is to analyze across operations, extract systematic signals from noise, and generate actionable insights in real time. https://www.evaluationengineering.com/part-average-testings-popularity-grows-in-the-semiconductor-industry

yieldWerxhat einen Beitrag geschrieben.13. September 2017

With the increase in the number of semiconductor devices being produced annually, the data being generated is increasing manifolds too, making it relevant and necessary to deploy semiconductor big data solutions. http://yieldwerx.com/adding-4th-v-semiconductor-big-data-dimensions/

yieldWerxhat einen Beitrag geschrieben.4. August 2017

An end-to-end semiconductor yield analysis tool now includes the automated collection of data from multiple nodes of the operations, be it test floor or process equipment. https://www.semiwiki.com/forum/f293/semiconductor-yield-management-high-volume-production-9240.html

yieldWerxhat einen Beitrag geschrieben.19. Juli 2017

Statistical Process Control for semiconductor industry has become a new norm to successfully monitor the processes on the assembly floor to improve quality and to reduce scraps. http://anysilicon.com/process-control-high-volume-semiconductor-manufacturing/

yieldWerxhat einen Beitrag geschrieben.11. Juli 2017

With the advancement in assembly test floor operations and addition of the complex equipment, the data generated is now collected in real-time with the ability to trigger alarms and control the assembly line in case of occurrence of failures or issues related to wafers or the test equipment. http://anysilicon.com/managing-semiconductor-test-data-current-age/

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