Adriana Rodrigues

I acquired deep knowledge in different X-ray diffraction methods dedicated for the structure characterization of thin films, multilayer systems and polycrystalline specimens. I have gained good experience in combining diffraction methods such as X-ray reflectivity, symmetric and asymmetric diffraction and grazing incidence diffraction dedicated in monitoring the structure during a growth process like Pulsed Laser Deposition.

Deposition, characterization and application of ZnO nanostructured films: Glucose and Urea biosensors.