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Karthik Narne

Angestellt, Quality Manager for Light control units, Continental AG, Continental Automotive GmbH

Skills

Qualitätsplanung
8D
Audit
FMEA
Qualitätsmanagement
Reklamationsmanagement
PPAP
ISO
ISO 9000
Qualitätskontrolle
A3 reporting
5 why
Customer Relationship Management (CRM)
Automotive SPICE (ASPICE)
Atlassian Confluence
Atlassian Jira
APQP
Automotive engineering
SAP
Quality Planning
ISO/TS 16949
VDA 6.3
Corrective and Preventive Actions
Project Management
Risk management
Six Sigma
MS Office
Supplier Management
QMS
IATF 16949
Quality Testing
Root Cause Analysis
Risk Analysis
Quality Management Methods
Quality Audits
Complaints Processing
quality driven
Supplier Evaluation

Timeline

Professional experience for Karthik Narne

  • Current 5 years and 10 months, since Aug 2019

    Quality Manager for Light control units

    Continental AG, Continental Automotive GmbH

    Plan and track all quality objectives and agree with the customer The development and implementation of the quality concept, as well as the coordination with the customer. Define, assess and track quality and customer requirements in terms of quality. Evaluate the maturity of the project and escalate it to the management, if necessary. The error analysis in case of product or process errors in the development phase advance.

  • 3 years and 3 months, May 2016 - Jul 2019

    Quality and Risk Manager

    Zumtobel Group

    Maintaining the relevant management system documentation of the Special Purpose Products (SPP)Business Division, based on the strategy. Defining the appropriate risk management requirements and deriving the required measures for the business processes in liaison with the process owners. Performing a controlling function in respect of adherence to statutory quality and environmental standards. Internal Auditing (based on EN ISO 9001 and 14001 standards) and performing external supplier audits(across EUROPE).

  • 1 year and 4 months, Jan 2015 - Apr 2016

    Customer Quality Engineer

    NXP Semiconductors Austria GmbH

    Acting as technical contact interface to main customers to improve the customer satisfaction (quality issues, product handling problems, ppm cooperation) Handling and resolving customer product returns, technical operations related complaints, and generating customer reports Driving the quality improvements process in view of cost reduction, quality increase and technical related issues Furthermore, I am responsible for: Secure Data-Key delivering, which is an exciting new business differentiator for NXP.

  • 2 years and 5 months, Aug 2012 - Dec 2014

    Product Reliability and Customer Quality Engineer

    ams OSRAM

    Drive and manage quality and reliability issues, as well as continuous improvement in all areas of interest. Provides Quality Engineering support and work with ams AG. Internal organization to resolve quality issues at customer site and improve product quality in the field. Co-operation within project team for review meetings, Design FMEAs, Test FMEAs, Process-FMEAs Supports product development, product qualification and release to production at ams AG and customer site to achieve expected quality on time

  • 1 year and 8 months, Dec 2010 - Jul 2012

    Failure Analysis Engineer

    Infineon Technologies Austria AG, Villach

    Perform a Scanpath and IDDQ Tests to Digital part on an IC using PXIsystem. Establishment of new FA-techniques for advanced technologies. RMA-processing: Initiates and recommends containment/corrective action on the basis of technical analysis Performs failure analysis on non-conforming material and does 8Dreporting Follows up improvement and corrective actions.

  • 1 year and 6 months, Jun 2009 - Nov 2010

    Research Intern

    lakeside labs

    Compares different kinds of ADCs and DACs, including both internal and external ADCs and DACs on the microcontroller. These internal ADCs and DACs are built in to microcontroller MSP430FG4618 while external ADCs and DACs, are built separately on HPA-MCU interface board which is provided by Texas Instruments (ti). These converters can be controlled with the microcontroller. Finally, these results concluded with the identified errors of both INL and DNL from all the converters that are used.

Languages

  • English

    Fluent

  • German

    Basic

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