Tashfain Yousuf

Semiconductor process tools, Plasma, ion-implant, etching, sputtering, process engineering, troubleshooting, maintenance.

Impact of strain produced by diverse structures and Si - C as source/drain material on electron mobility in FDSOI transistors using COMSOL simulations and Transmission Electron Microscope (TEM) Precession Electron Diffraction (PED) analysis of real models.

Carrier mobility optimization in MOSFETs. Model simulations in COMSOL and TEM analysis for strained silicon channel devices.

Stress-strain analysis of metallic glass composites (MGCs) of CuZrAl.

Structural Analysis of Hafnia Zirconia grain cells using Scanning Electron Microscope. Temperature, dopants and different top electrodes effects on material properties. In this project Fabrication of memory cells was performed in clean room using PVD Sputtering, thickness measurements using XRR, XRD for crystal phases and wet etching was performed on samples.

Electrical Characterization of High K Ferroelectric memory cells using state of the art measurement tools in clean room environment. 4 Point probe stations for FORC, IV Leakage, FM, DHM, CV, Impedance and Dot size measurements.

Manufacturing and testing of solar panels. Soldering, lamination, baking, EL and IV testing of Solar cells.

Semiconductor Technology for Nanoelectronic Systems. Subjects: CMOS Technology, 3D Systems Integration and Reliability Aspects.

Electronic systems and design. Subjects: Digital Circuits, Digital Logic Design, Signal Analysis, Calculus and System Automation.