Galina Kobelt

• Ramp up new nm-technologies : speed ramp of 58 nm deep Trench technology; speed ramp of 65 nm Buried Word Line (bWL) technology • Extensive analysis of manufacturing , parametric, defect density and electrical data to understand the fail mechanisms. Used statistical methods, physical failure analysis • Equipments commonality analysis, based on results decisions about tool-stop, line stop • Evaluation of process change experiments, pilot runs and Design of Experiments (DoE) • Products qualification, exp

• Personal Responsibility for data managing of external memory products (nvSRAM,SRAM) • Full Data integration of new Subcontractor Factories into the ZMD-IT-System • Developing an information system to analyze and represent Product-significant Data using Oracle Developer, PL/SQL, C, Perl and UNIX Shell scripts. • Team Leader - 5 colleagues in team. • Creation of Documentation and data-organization relevant Specs • Analysis of PCM, WAFERsort, Endtest(Finaltest), Process Data(Inline Data) • Yield monitorin