Guerkan Ilicali

Angestellt, Senior Principal Development Engineer, Nexperia Germany GmbH
Hamburg, Deutschland

Fähigkeiten und Kenntnisse

Project Management
Teambuilding
Supervision
Quality Procedures
Manuals
Reporting & Documentation
Production Ramp-Up
Technology Qualification
Technology Fab-Transfer
Solid State
Device Physics
Device Design
Process Integration
Design Rule Definition
Design Manual
FMEA Test Structure Development
& Layout
Process Control Monitors
(PCM)
Statistical Process Control
(SPC)
Electrical Characterization
Wafer Level Reliability
(WLR)
Failure Analysis
Yield Enhancement
Model-to-Hardware Correlation
Device Modeling
(SPICE)
Parameter Extraction

Werdegang

Berufserfahrung von Guerkan Ilicali

  • Bis heute 4 Jahre und 6 Monate, seit Nov. 2021

    Senior Principal Development Engineer

    Nexperia Germany GmbH

    System Architect, Power Rectifiers

  • Bis heute 13 Jahre und 1 Monat, seit Apr. 2013

    Principal Engineer / Process Integration & Devices

    TDK Micronas

    Process & device integration HVCMOS technology for automotive products. Introduction and qualification of new process modules and devices. Design rule definition based on statistical process variations and tolerances. Electrical parameter specifications. Test structure development. Wafer level reliability. Planning, coordination and analysis of fab experiments. Excel-VBA-Tool development for data analysis. Yield engineering support. Development and integration. Continuous improvement, Zero ppm.

  • 1 Jahr und 11 Monate, Juni 2011 - Apr. 2013

    Head of Technology Development

    Telefunken Semiconductors

    • Technical managerial position supervising R&D team of 10 employees. Responsible for deploying employees for particular tasks according to their skill sets and optimize resource utilization. • Technical foundry support. • Lead role in technology development for Smart Power Integration - 0.35um high voltage BCD MOS technology • Coordination and implementation of technology development relevant quality assurance policies, specifications and technical documentation. Intern/Extern Audit-compliance.

  • 1 Jahr und 5 Monate, Jan. 2010 - Mai 2011

    Process Integration / Device Engineer

    Telefunken Semiconductors

    • Process Integration. Definition of unit process specifications based on statistical process control. • Device Design & Library. Introduction of novel devices into design flow. • Test structure development and layout. Definition of electrical parameter specifications based on statistical analysis. • Wafer Level Reliability • Lot & personnel supervision. Split lot plans, experimental runs, fab run-card optimizations. • Design Manual, FMEA, Relevant quality assurance documentation.

  • 2 Jahre und 7 Monate, Nov. 2006 - Mai 2009

    Senior Device Engineer

    Qimonda AG

    Design Technology Interface - Product Development- • Electrical device characterization and compact modeling for 90, 65 and 46nm technology nodes. • Model-to-Hardware correlation, parameter extraction & model development. • Design Manual support and Layout Rules. • Implementation of layout dependencies into design flow (STI Stress, well proximity, device matching etc.). • Test structure development and layout definition for sub-micron effects. • MS Excel-Tool development for parameter extraction.

  • 3 Jahre und 8 Monate, März 2002 - Okt. 2005

    Researcher - Ph.D. Student

    Infineon Technologies AG

    Corporate Research, Nano Devices Laboratories. • Realization of sub-50nm Planar Single and Double Gate SOI CMOS Devices. • Device design, device simulation and process integration. • Layer transfer (fusion wafer bonding) for fabrication of planar Double Gate transistors. • Lot supervision, planning, coordination and analysis of experiments.

  • 8 Monate, Aug. 2001 - März 2002

    R&D Engineer

    Infineon Technologies AG

    Corporate Logic - Department of Technology Innovation- • Technology pre-development for sub-100nm technology nodes. • CMOS process integration, particularly transistor gate stack, FEOL (Front-End-of-Line), high-K gate dielectrics and metal gates • Oxynitrides with Atomic Layer Deposition (ALD) for CMOS gate stack.

Ausbildung von Guerkan Ilicali

  • Bis heute 23 Jahre und 8 Monate, seit Sep. 2002

    Electrical Engineering

    Technical University of Munich (TUM)

    Device design and simulation (TCAD), Process Integration, Wafer Bonding. Dissertation: Design and fabrication of planar double gate SOI transistors with wafer fusion bonding.

  • 1 Jahr und 10 Monate, Sep. 1999 - Juni 2001

    Engineering Physics

    Royal Institute of Technology (KTH), Stockholm, Sweden

    Quantum Physics, Solid State Theory and semiconductor physics. Master project in Solid state electonics entitled " Zirconium dioxide thin films as a high-K gate dielectric for future CMOS technologies"

  • 3 Jahre und 10 Monate, Okt. 1994 - Juli 1998

    Physics

    Yildiz Technical University (YTU), Istanbul, Turkey

    Quantum pyhsics, atomic&molecular physics, Solid state theory. Graduation Thesis: Introduction to computer simulation techniques in physics

Sprachen

  • Deutsch

    C1 (Fließend)

  • Englisch

    C1 (Fließend)

  • Türkisch

    C2 (Verhandlungssicher / Muttersprachlich)

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