Mark Joseph Daroy

• Worked for Integrated Device Technology Sdn. Bhd. and provided test solution on RF products for cellular base station application. • Supported IDT RF test engineers on debugging their test issues from RF to digital testing. • Developed test program for RF mixers and VGAs using LTX Credence MX testers. • Formulated test documentation for IDT’s RF front end devices.

• Developed RF test solution for WLAN, Bluetooth, RKE, and Zigbee products. • Updated and sustained IGXL/VBA RF test programs on Teradyne J750 with Aeroflex AXRF subsystem. • Automated API conversion by developing script for converting Aeroflex and National Instrument PXI APIs • Formulated and maintained test documentation for different wireless measurement.

• Developed Probe and Final Test program and designed test hardware for 8-bit AtTiny series products using Teradyne Magnum PV ATE. • Conducted continuous test cost improvement (increased sites parallelism, test insertion reduction, test optimization and yield enhancement) for ARM- based microcontrollers. • Provided remote and on-site product technical support to subcontractor facilities across Asia for resolving AVR AtTiny production issues encountered.

• Designed and debugged test program and hardware for probe test solution of AD583X converter products. • Coordinated with design and application engineers from Limerick, Ireland and Valencia, Spain in evaluating new silicon for Lens Drivers products and exposing bug and issues. • Performed device characterization, yield analysis and product qualification from tape-out of first silicon to final release.

• Debugged and repaired VI sources, pin electronics and precision analog sources printed circuit boards for Teradyne Catalyst and microFLEX ATE. • Successfully formulated repair process documentation and resulted to improved repair quality, faster throughput and reduction of customer returns. • Implemented a monitoring procedure to regularly check cycle time for board on repair