Dr. Nicole Jeutter

Angestellt, Quality Assurance PT E/E; Semiconductor Strategy, AUDI AG
Ingolstadt, Germany

Fähigkeiten und Kenntnisse

Process management
Project management
Lean Six Sigma
Opto Semiconductor Production FE
Quality Management in production
Supplier Management
VDA 6.3 Audit qualified
FMEA
8D
Ishkawa & 5 Why
strong communications and networking skills
intercultural competence
International experience
English
French
FIB
TEM& REM
x ray diffraction
XPS
Semiconductors
Material Anaylsis Methods
Six Sigma Black Belt
Lean Manager

Werdegang

Berufserfahrung von Nicole Jeutter

  • Current 7 years and 7 months, since Nov 2018

    Quality Assurance PT E/E; Semiconductor Strategy

    AUDI AG
  • 1 year and 4 months, Jul 2017 - Oct 2018

    Quality Component Engineer

    RF360 Europe GmbH - A Qualcomm TDK Joint Venture

  • 4 months, Mar 2017 - Jun 2017

    Lean Six Sigma Project Specialist

    Habmann Group

    Weiterbildung als Lean Six Sigma Project Specialist, Lean Six Sigma Black Belt, Lean Six Sigma Trainer, Ganzheitliche Führung

  • 6 months, Feb 2016 - Jul 2016

    Quality Manager

    Continental AG
  • 5 years, Feb 2011 - Jan 2016

    Senior Process engineer

    Osram Opto Semiconductors GmbH

  • 3 years and 1 month, Oct 2007 - Oct 2010

    Research Scientist in Material Science, delegated to Grenoble France

    Forschungszentrum Dresden Rossendorf

    Research in the field of Applied Photovoltaic, Magnetron Sputtering of multilayer samples, Applied methods: RBS, TEM, X-Ray diffraction and scattering , Raman scattering, 2nd scientist at beamline at the ESRF and co-responsible for the developement and realisation of the experiments, user support and co-supervision of a Ph.D. Student.

  • 2 years, Oct 2005 - Sep 2007

    Post-Doctoral Researcher in Thin Film Technology

    European Synchotron Radiation Facility, Grenoble, France

    Postdoctoral research in the field of nanoparticles under catalysis conditions, Postdoctoral research in the field of dewetting processes of thin films. Applied techniques AES, XPS, Surface x-ray diffractions. Support of international users, development of new experiments at the beamline, super vision technical staff

  • 3 years and 1 month, Sep 2002 - Sep 2005

    Ph.D. Student in Surface/Semiconductor Science

    University of Munich

    Research in Semiconductor Science, Applied Methods: LEED, AFM, Auger and X-ray diffraction, Co-Supervision of Diploma Students, Maintenance of UHV Chambers in our group, network administration, part time lectures for the first year students

  • 1 year and 11 months, Nov 2000 - Sep 2002

    R & D Engineer in Semicondutor Industry

    Siemens Coperate Technology

    Preparation of TEM Samples, with the help of Focus Ion Beam, normal Cross section TEM and special TEM for Semiconductor Research on pre- processed samples for Siemens and other international customers like TI, EPCOS, SOITEC etc.

  • 1992 - 2000

    Business Account Management in the IT Branch

    Siemens IT Service GmbH (formerly Siemens-Nixdorf)

    Business Account Management in the field of IT Technology, Controlling

Ausbildung von Nicole Jeutter

  • 3 years and 1 month, Sep 2002 - Sep 2005

    Surface Physics/ Surface Crystallography

    University of Munich

    Thin films, Semiconductors, High-k gate oxides, Molecular beam epitaxy, Electron and X-Ray Diffraction, Auger Spectroscopy, Atomic force microscopy, Vacuum Technology

  • 3 years and 8 months, Oct 1998 - May 2002

    Crystallography

    University of Munich (LMU)

    Surface Science, Material Science, Petrology, Chemistry

  • 2 years and 1 month, Oct 1996 - Oct 1998

    Geology

    University of Munich

    Crystallography, Physics , Mineralogy , Chemistry

Sprachen

  • English

    C1 (Fließend)

  • German

    C2 (Verhandlungssicher / Muttersprachlich)

  • French

    C1 (Fließend)

  • Spanish

    A1-A2 (Grundkenntnisse)

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