Dr. Seol-Min Yi

• The fatigue behavior of inkjet-printed Ag film for flexible applications • Development of highly reliable interconnects and electrodes using inkjet printing

• Design of DRAM cell transistors: retention time (GIDL, juction engineering) and performance (on current) • Improving devices (from resistors to capacitors and transistors) based on statistical data analysis. • Evaluating devices in DRAM by measuring their characteristics including designing TEG (test element group). • Electrical reliability of transistors: degradation of dynamic refresh time after FN stress, NBTI, TDDB, HEIP)

Highly conductive metal interconnects for flexible devices using inkjet-printed nanoparticles; Adhesion between thin films quantitatively using 4 point bending; Cu alloy interconnects with self formatting barrier Investigating time dependent dielectric breakdown of porous low-k materials

Undergraduate Thesis: Analysis of abnormal grain growth at room temperature and microstructure in electroplated copper thin films