amirhossein ahmadi

• Diagnosed EMI-induced failure of a BMS transceiver under IEC 62132-4 DPI stress: identified three distinct EMI failure mechanisms in a BMS galvanically isolated transceiver (VIF). • Designed targeted IC-level countermeasures for each failure path, protective diodes, anti-parallel diode bridges, and an active clamp circuit, validated on a fabricated test chip. • Achieved >15 dB EMI robustness improvement, verified through DPI measurements and correlated with transistor-level Cadence/Spectre simulations. •

• Developed data analysis workflows and visualization tools using Python for large engineering datasets

• Focused on hardware-level EMI failure analysis, immunity characterization, and robust countermeasure design for automotive ICs under DPI stress environments. • Developed mathematical models to analyze electromagnetic susceptibility and verified theoretical work through standardized laboratory tes

• Full-custom analog IC design flow: schematic capture, layout, post-layout verification in 65 nm CMOS. • Introduced a novel 11-bit 1.2 GS/s hybrid DAC hybrid current-steering DAC architecture. • Proposed a resistor-ladder weighting technique reducing current-source count, improving matching and re

• Built a foundational understanding of microelectronics, semiconductor devices, and fundamental circuit analysis methodologies.