Ivan Alić

• THz and mm wave material testing and characterization, imaging and spectroscopy • Time domain and frequency domain THz systems • measurement system design • Prototype instrumentation development and testing

• Atomic force microscopy • Scanning microwave microscopy - (AFM-SMM, STM-SMM) • RF modeling and simulation • Calibrated RF measurements • AFM / SMM applied to: defect detection in semiconductor devices, battery electrodes, biology

• Scanning probe microscopy - (AFM, STM) • Electrical AFM modes - EFM, current sensing, KFM • Scanning microwave microscopy: semiconductor structure profiling and defect detection • Microwave measurements • RF material testing: antenna measurements of composite materials • Dielectric probe and resonator measurements • Instrumentation control SW development

Smart card middleware and other smart card software development an maintenance. technologies used: JavaCard, NXP smart card, C / C++

Linux and Windows system installation and administration, hardware maintenance and repair, video wall maintenance, video content preparation, Linux embedded systems maintenance

computer training for beginners and seniors

Semiconductor devices, analogue and digital design Masters thesis in Fin-flash memories with nitride charge trapping layer